CT160/+ X-Ray CT Temperature Control Stage

CT160 – In-Situ Temperature Control Stage for X-Ray CT

In association with the major manufacturers µXCT systems including Zeiss, RX Solutions, Tescan/XRE, Nikon, Thermo Fisher Scientific and Waygate/GE we are now able to offer an integrated tensile testing solution for your µXCT application. Using tensile testing with µXCT provides a clear visual interpretation of how the properties of materials and composites change under different loading conditions. The compact design of these testing stages allow them to be used with the smallest high resolution micro CT systems providing a range of tensile and compression stages with forces up to 20kN and resolutions down to 25mN. Systems are controlled with a keypad control panel for temperature display and control. The CT160 Peltier stage provides controlled heating and cooling of the sample from −20 °C to +160 °C during CT imaging, enabling temperature-dependent in-situ mechanical testing. Further details and pricing is available from your micro CT supplier or direct from Deben.