Deben tensile and compression stages are specifically designed to compliment a variety of in-situ imaging techniques and provide insight into physical changes to a structure.
In addition, utilising in-situ tensile testing with optional heating and cooling allows new insights into material properties.
The tensile stage can be used outside the SEM under an optical microscope and inside the SEM when a higher magnification and better depth of focus is required. This bridges the gap between the light and electron microscopy worlds and allows for correlative microscopy techniques.
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Deben tensile and compression stages are specifically designed to compliment a variety of in-situ imaging techniques and provide insight into physical changes to a structure.
In addition, utilising in-situ tensile testing with optional heating and cooling allows new insights into material properties.
One Application Scientist describes our tensile stage: “The tensile stage from Deben is a robust device which is as easy to use as the desktop SEM. It can be loaded into the SEM just like any other sample holder. There is no need to install or prepare any parts inside the SEM which really shortens the time to image.”
The tensile stage can be used outside the SEM under an optical microscope and inside the SEM when a higher magnification and better depth of focus is required. This bridges the gap between the light and electron microscopy worlds and allows for correlative microscopy techniques.
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A Nanoscience AFM team decided on the Deben MT200, “firstly, it allows us to work simultaneously with our tip-scanning AFM and simultaneous top view observation. Secondly, the bi-directional stretching operation means the centre region of the sample will stay in position related to the optical axes and the adjusted AFM cantilever. We also find the height and overall size of the stretching stage allows us to mount it on our base stage providing the flexibility either as a stand–alone system or to use on top of an optical microscope body.”