ARM2™ STEM Detector

The Deben ARM2 STEM detector is a retractable SEM detector that enables bright field, dark field, and phase contrast STEM imaging, with flexible signal mixing and high-sensitivity detection for detailed microstructural analysis.

ARM2™ STEM Detector

ARM2™ STEM detector

The Deben Solid state Gen5™ SEM detector is modular, with the motorised ARM2™ mechanical interface at the heart of the system. Also included are Gen5™ electronics and software GUI, as well as various diode options available for both STEM and BSE imaging. ARM2™ can be adapted to most conventional SEMs having a free chamber port at 90° to the beam axis. Control of diode segments and brightness/contrast is from within the software GUI, with up to three simultaneous video channels available (optional).

A retractable PN diode semiconductor STEM detector configured with four Dark Field (DF) diodes wired as two pairs and a single Bright Field (BF) diode. The system may be operated in BF mode, DF mode or DF Phase Contrast mode along with mixing between segments, DF+BF for example.

Twelve 3mm grids can be fitted to the standard STEM grid holder, allowing multiple specimen analysis. A retractable arm complete with Deben Gen5 electronics allows the STEM Detector to be used with any SEM with a free chamber port and AUX video input. The 12 position grid holder is airlock compatible and supplied complete with stage dovetail/sledge as required.

The STEM detector assembly uses a single Bright Field and 4 element Dark Field diode. Such is the performance of this design that it has proved equally successful fitted to both FEG and Tungsten SEMs. The STEM detector assembly inserts below the grid holder and has X,Y, Z position adjustment. Dark field diodes are configured so they can operate in full Dark Field or Dark Field Phase Contrast mode.

Deben Gen5 electronics is configured with four input channels and a single video output channel (optional two or three simultaneous video outputs).

Four Element Dark Field and Bright Field

Four Element Dark Field (DF) and Bright Field (BF)

Triple Annular STEM

Triple Annular STEM

Bi-Annular 4 Quadrant STEM

Bi-Annular 4 Quadrant STEM

Features        

        Four Element Dark Field (DF) and Bright Field (BF)

    • x2 modes of operation, including DF and BF
    • Hardware configuration allowing over 9 combinations of signal

      Triple Annular STEM

    • Ideal for life sciences and material science applications
    • x4 modes of operation, including HAADF, MAADF, LAADF and BF
    • Hardware configuration allowing over 14 combinations of signal

      Bi-Annular 4 Quadrant STEM

    • Ideal for material science applications
    • x5 modes of operation, including HAADF, ADF, DF, BF and Phase Contrast
    • Hardware configuration allowing over 34 combinations of signal, including bi-directional phase contrast imaging